If playing around with CRC RevEng fails, what next? That is the gist of my question. I am trying to learn more how to think for myself, not just looking for an answer 1 time to 1 problem.
Assuming the following:
1.) You have full control of white box algorithm and can create as many chosen sample messages as you want with valid 16 bit / 2 byte checksums
2.) You can verify as many messages as you want to see if they are valid or not
3.) Static or dynamic analysis of the white box code is off limits (say the MCU is of a lithography that would require electron microscope to analyze for example, not impossible but off limits for our purposes).
Can you use any of these methods or lines of thinking:
1.) Inspect "collisions", i.e. different messages with same checksum. Perhaps XOR these messages together and reveal something?
2.) Leverage strong biases towards certain checksums?
3.) Leverage "Rolling over" of the checksum "keyspace", i.e. every 65535 sequentially incremented messages you will see some type of sequential patterns?
4.) AI ?
Perhaps there are other strategies I am missing?
CRC RevEng tool was not able to find the answer using numerous settings configurations
EDIT: Here are some example messages
Sample 1: FFFFFFFFFFFF /
0100100A00000000000000000000FFFFFFFFFF72BE
Sample 2: 000000000000 /
0100100A00000000000000000000FFFFFFFFFF2A3D
Sample 3: 000000000001 /
0100100A00000000000000000000FFFFFFFFFF89F7
Sample 4: 000000000002 /
0100100A00000000000000000000FFFFFFFFFF0864
Sample 5: 000000000003 /
0100100A00000000000000000000FFFFFFFFFFABAE
Sample 6: 000000000004 /
0100100A00000000000000000000FFFFFFFFFF9396
Sample 7: 000000000005 /
0100100A00000000000000000000FFFFFFFFFF305C
Sample 8: 000000000006 /
0100100A00000000000000000000FFFFFFFFFFB1CF