Test multiple decoupled input ports using OrderedDecoupledHWIOTester

Question

Does OrderedDecoupledHWIOTester support testing a DUT that has two or more decoupled input ports?

For example, is there any way to express something like:

inputEvent(decoupledPort1.bits <- 10)
inputEvent(decoupledPort2.bits <- 11)

to create two series of values gated concurrently into these two ports?

Answer 1

The short answer is no. The Ordered part of OrderedDecoupledHWIOTester means that the input events are not concurrent. I think you may be able to implement this using the chisel3.iotesters.AdvTester. But I don't see any good examples. I will see if I can create one.