Hemispherical electron energy analyzer

A hemispherical electron energy analyzer or hemispherical deflection analyzer is a type of electron energy spectrometer generally used for applications where high energy resolution is needed—different varieties of electron spectroscopy such as angle-resolved photoemission spectroscopy (ARPES), X-ray photoelectron spectroscopy (XPS) and Auger electron spectroscopy (AES) or in imaging applications such as photoemission electron microscopy (PEEM) and low-energy electron microscopy (LEEM).

It consists of two concentric conductive hemispheres that serve as electrodes that bend the trajectories of the electrons entering a narrow slit at one end so that their final radii depend on their kinetic energy. The analyzer, therefore, provides a mapping from kinetic energies to positions on a detector.

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