Field ion microscope
The Field ion microscope (FIM) was invented by Müller in 1951. It is a type of microscope that can be used to image the arrangement of atoms at the surface of a sharp metal tip.
On October 11, 1955, Erwin Müller and his Ph.D. student, Kanwar Bahadur (Pennsylvania State University) observed individual tungsten atoms on the surface of a sharply pointed tungsten tip by cooling it to 21 K and employing helium as the imaging gas. Müller & Bahadur were the first persons to observe individual atoms directly.
This article is issued from Wikipedia. The text is licensed under Creative Commons - Attribution - Sharealike. Additional terms may apply for the media files.